Article ID Journal Published Year Pages File Type
9837442 Physica B: Condensed Matter 2005 7 Pages PDF
Abstract
To describe the electromigration in these conditions a mathematical model was applied, which assumes the existence of two diffusion mechanisms: interstitial and defect-interstitial ones, each of which is characterized by the above-mentioned parameters. For each of the mechanisms, the dependence of these values on external stretching was determined.
Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Preview
Influence of external stretching on hydrogen electromigration in Pd and PdCu, PdAg alloys
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