Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9837442 | Physica B: Condensed Matter | 2005 | 7 Pages |
Abstract
To describe the electromigration in these conditions a mathematical model was applied, which assumes the existence of two diffusion mechanisms: interstitial and defect-interstitial ones, each of which is characterized by the above-mentioned parameters. For each of the mechanisms, the dependence of these values on external stretching was determined.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Ryszard Pietrzak, Roman Szatanik,