| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9837525 | Physica B: Condensed Matter | 2005 | 4 Pages |
Abstract
A reflectometer with vertical sample position has been recently installed at the research reactor NUR. In this paper, a description of this instrument is presented. The test has been performed with a ten nickel-titanium bilayers monochromator with a total thickness of 300Â nm. The nominal thicknesses of each bilayer are 15Â nm Ti and 15Â nm Ni.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
M. Izerrouken, B. Guedioura, B. Saichi, A. Nedjar, A. Meftah, M. Nekab,