Dielectric properties of Sr1+XBi2−(2/3)X(VXTa1−X)2O9 [X=0, 0.1 and 0.2] ceramics

In this paper, we report the results of systematic studies on the dielectric properties of Sr1+XBi2−(2/3)X(VXTa1−X)2O9 [X=0, 0.1 and 0.2] ferroelectric ceramics. The X-ray diffraction results confirm that single-phase layered perovskites were formed within the composition range studied in this work without any detectable secondary phase. Higher Curie temperature and enhanced dielectric constant at the transition temperature were clearly observed with the partial substitution of pentavalent tanatalum ions by smaller pentavalent vanadium ions. The negative shift of Curie temperature with increasing frequency was observed for Sr1+XBi2−(2/3)X(VXTa1−X)2O9 [X=0.1 and 0.2] ceramics.