Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9837870 | Physica B: Condensed Matter | 2005 | 4 Pages |
Abstract
InP (0 0 1) wafers were irradiated at room temperature and at liquid nitrogen temperature with swift Au ions. The bulk and near surface structure was investigated by means of X-ray grazing incidence diffraction and measurements at the (0 0 2) Bragg reflection. While irradiation at room temperature with 350 MeV Au ions induced amorphization at a fluence of Φt=1Ã1013Au/cm2, cooling to liquid nitrogen temperature during irradiation reduces the defect generation. A threshold value for complete bulk amorphization of Φt=6Ã1012Au/cm2 was observed. The near surface lattice structure is less affected by the irradiation than the bulk.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
N. Darowski, I. Zizak, G. Schumacher,