| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9837876 | Physica B: Condensed Matter | 2005 | 4 Pages |
Abstract
We applied ultrasmall angle X-ray scattering (USAX) in the context of pressure sensitive adhesive (PSA) debonding. Microscopic structures, as detected by USAX, complete macroscopic structural information from standard optical microscopy. As a model PSA, a statistical copolymer was investigated. Asymmetric USAX pattern were detected. The data are modelled by a tilted one-dimensional grating of slits.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
E. Maurer, S. Loi, D. Wulff, N. Willenbacher, P. Müller-Buschbaum,