Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9837931 | Physica B: Condensed Matter | 2005 | 4 Pages |
Abstract
Making real the ambition of performing polarization analysis on a thermal time-of-flight (TOF) spectrometer has been under discussion for several years. Recent developments at the ILL have brought this goal closer and we are now confident that full XYZ-PA can be installed on the existing thermal TOF spectrometer IN4 at ILL. We present here a brief discussion of these developments and highlight the methods foreseen in order to arrive at Polarization AnalysiS on a Thermal tof Inelastic Spectrometer (PASTIS).
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
John A. Stride, Ken H. Andersen, Amir P. Murani, Hannu Mutka, Helmut Schober, J. Ross Stewart,