Towards polarization analysis on a thermal time-of-flight spectrometer

Making real the ambition of performing polarization analysis on a thermal time-of-flight (TOF) spectrometer has been under discussion for several years. Recent developments at the ILL have brought this goal closer and we are now confident that full XYZ-PA can be installed on the existing thermal TOF spectrometer IN4 at ILL. We present here a brief discussion of these developments and highlight the methods foreseen in order to arrive at Polarization AnalysiS on a Thermal tof Inelastic Spectrometer (PASTIS).