Application of an inductive technique to the characterization of superconducting thin films based on power law I-V relations

An inductive technique was applied to the contactless characterization of thin film superconductors. The third harmonic signal was analyzed based on power law I-V relations instead of the critical state model as in previous works. The gradual increase in the third harmonic signal as well as the frequency dependence is naturally explained. From the frequency dependence, we can deduce the n-value of the I-V relation. A simple computer simulation reproduces the experimental results fairly well. It is shown that the technique can be safely applied to coated conductors with a normal metallic layer for the stabilization.