Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9844908 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2005 | 9 Pages |
Abstract
A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5μm Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of δxbeam=20μm and δÏbeam=25μm, respectively, in the NuMI beam which has 1 mm spot size.
Related Topics
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Authors
S.E. Kopp, D. Indurthy, Z. Pavlovich, M. Proga, R. Zwaska, S. Childress, R. Ford, C. Kendziora, T. Kobilarcik, C. Moore, G. Tassotto,