| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9845562 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2005 | 6 Pages |
Abstract
In the present work, a new radiographic methodology which makes use of conventional X-ray films and low-energy electrons as penetrating radiation, to inspect low-thickness samples, has been investigated. The radiographic characteristics for the “electron beam-film” set, regarding its sensitivity to discern thickness changes of materials, as well as the spatial resolution achieved in the image have been determined. Some radiographs are presented and demonstrate the method's potential to inspect thin samples.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
R. Pugliesi, M.L.G. Andrade, M.A. Stanojev Pereira, F. Pugliesi,