Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9868098 | Physics Letters A | 2005 | 7 Pages |
Abstract
Electron transport in a crossed nano-wire junction is studied using a tight-binding model. Increase in the inter-wire tunneling coupling strength suppresses the transmissions through the junction around the first subband edge. The junction's transport characteristics can be explained by the formation of bound or quasi-bound states at the junction.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Physics and Astronomy (General)
Authors
J.H. Wei, K.S. Chan,