Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9868385 | Physics Letters A | 2005 | 7 Pages |
Abstract
In this Letter, we apply the transverse-field Ising model (TIM) with a four-body interaction term to ferroelectric thin films. By defining a critical value (Jâ²/J)c, the critical line between the first-order and the second-order phase transition is obtained for ferroelectric thin films. We discuss influence of the film thickness on the critical value (Jâ²/J)c. Behavior of the phase transition and the dielectric susceptibility of ferroelectric thin films are investigated within the mean-field approximation.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Physics and Astronomy (General)
Authors
Qing Jiang, Yong Mei Tao,