| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9953560 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2018 | 4 Pages |
Abstract
Sputter deposited Mg2FexSi1-x films of 250â¯nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
T.T. Trinh, K. Asano, R. Heller, H. Reuther, J. Grenzer, H. Schreuders, B. Dam, K. Potzger,