Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below) Fulltext Access 7 Pages 2010
A prognostics and health management roadmap for information and electronics-rich systems Fulltext Access 7 Pages 2010
Development of embedded piezoelectric acoustic sensor array architecture Fulltext Access 7 Pages 2010
Constant current stress-induced leakage current in mixed HfO2–Ta2O5 stacks Fulltext Access 7 Pages 2010
A model for the critical voltage for electrical degradation of GaN high electron mobility transistors Fulltext Access 7 Pages 2010
Forward-stepwise regression analysis for fine leak batch testing of wafer-level hermetic MEMS packages Fulltext Access 7 Pages 2010
Corrosion protection of anisotropically conductive adhesive joined flip chips Fulltext Access 7 Pages 2010
Characteristics analysis and optimization design of a new ESD power clamp circuit Fulltext Access 7 Pages 2010
Electromigration-induced stress in a confined bamboo interconnect with randomly distributed grain sizes Fulltext Access 7 Pages 2010
How future automotive functional safety requirements will impact microprocessors design Fulltext Access 7 Pages 2010
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations Fulltext Access 7 Pages 2010
Gate delay variability estimation method for parametric yield improvement in nanometer CMOS technology Fulltext Access 7 Pages 2010
Investigation of the shift of hot spot in lateral diffused LDMOS under ESD conditions Fulltext Access 7 Pages 2010
Charge trapping and reliability characteristics of ultra-thin HfYOx films on n-GaAs substrates Fulltext Access 7 Pages 2010
Improved resolution method to study at 3D the conduction phenomena inside GaAs PIN photodiode Fulltext Access 7 Pages 2010
Doping compensation for increased robustness of fast recovery silicon diodes Fulltext Access 7 Pages 2010
Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate Fulltext Access 7 Pages 2010
A multi-scale approach for investigation of interfacial delamination in electronic packages Fulltext Access 7 Pages 2010
Strength violation effect on soft-error detection in sub-micron technology Fulltext Access 7 Pages 2010
Effect of glue on reliability of flip chip BGA packages under thermal cycling Fulltext Access 7 Pages 2010
Experimental study of WL-CSP reliability subjected to a four-point bend-test Fulltext Access 7 Pages 2010
Modeling of board-level package by Finite Element Analysis and laser interferometer measurements Fulltext Access 7 Pages 2010
Predictive modeling of board level shock-impact reliability of the HVQFN-family Fulltext Access 7 Pages 2010
Improved method for determining the shear strength of chip component solder joints Fulltext Access 7 Pages 2010
An application of DMADV methodology for increasing the yield rate of surveillance cameras Fulltext Access 7 Pages 2010
Real 3D increases perceived depth over anaglyphs but does not cancel stereo-anomaly Fulltext Access 7 Pages 2010
Sequenced release of privacy-accurate information in a forensic investigation Fulltext Access 7 Pages 2010
Speaker verification from partially encrypted compressed speech for forensic investigation Fulltext Access 7 Pages 2010
Biological excitable media based on non-excitable cells and calcium signaling Fulltext Access 7 Pages 2010
Half-duplex relaying with serially concatenated low-density generator matrix (SCLDGM) codes Fulltext Access 7 Pages 2010
Pre-processing optimization for IBI mitigation in an OFDM system over channels with large delay spreads Fulltext Access 7 Pages 2010
Distributed circuit model for cold cathode fluorescent lamps in back-light unit of liquid crystal display Fulltext Access 7 Pages 2010
Federation of TeraGrid, EGEE and OSG infrastructures through a metascheduler Fulltext Access 7 Pages 2010
Perceptual thresholds for display lag in a real visual environment are not affected by field of view or psychophysical technique Fulltext Access 7 Pages 2010
Simulations of large-scale WiFi-based wireless networks: Interdisciplinary challenges and applications Fulltext Access 7 Pages 2010
Parallel SSOR preconditioning implemented on dynamic SMP clusters with communication on the fly Fulltext Access 7 Pages 2010
QoS analysis of medium access control in LR-WPANs under bursty error channels Fulltext Access 7 Pages 2010
Steering of sequential jobs with a distributed shared memory based model for online steering Fulltext Access 7 Pages 2010
Thin film joining for high-temperature performance of power semi-conductor devices Fulltext Access 8 Pages 2010
Alcohol sensors based on SWNT as chemical sensors: Monte Carlo and Langevin dynamics simulation Fulltext Access 8 Pages 2010
Effects of novel carboxylic acid-based reductants on the wetting characteristics of anisotropic conductive adhesive with low melting point alloy filler Fulltext Access 8 Pages 2010
Reliability growth modeling for in-service electronic systems considering latent failure modes Fulltext Access 8 Pages 2010
Modeling of drain current, capacitance and transconductance in thin film undoped symmetric DG MOSFETs including quantum effects Fulltext Access 8 Pages 2010
The use of Mahalanobis–Taguchi System to improve flip-chip bumping height inspection efficiency Fulltext Access 8 Pages 2010
Small signal parameter extraction of MESFET using quantum particle swarm optimization Fulltext Access 8 Pages 2010
Finite volume based CFD simulation of pressurized flip-chip underfill encapsulation process Fulltext Access 8 Pages 2010
Quantum circuit’s reliability assessment with VHDL-based simulated fault injection Fulltext Access 8 Pages 2010
Assembly reliability assessment and life estimation for a stacked area array device Fulltext Access 8 Pages 2010
On the generation of CCII and ICCII oscillators from three Op Amps oscillator Fulltext Access 8 Pages 2010
Low-power highly linear UWB CMOS mixer with simultaneous second- and third-order distortion cancellation Fulltext Access 8 Pages 2010
Electrical modeling and characterization of through-silicon vias (TSVs) for 3-D integrated circuits Fulltext Access 8 Pages 2010
Energy efficiency of error control coding in intra-chip RF/wireless interconnect systems Fulltext Access 8 Pages 2010
Design and simulation of sequential circuits in quantum-dot cellular automata: Falling edge-triggered flip-flop and counter study Fulltext Access 8 Pages 2010
Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiO2 gate dielectric stacks Fulltext Access 8 Pages 2010
The design and optimization methodology of a low-distortion sub-μWμW sample-and-hold stage for weak bio-currents Fulltext Access 8 Pages 2010
Effect of nano Al2O3 additions on the microstructure, hardness and shear strength of eutectic Sn–9Zn solder on Au/Ni metallized Cu pads Fulltext Access 8 Pages 2010
Variable-amplitude dither-based digital background calibration algorithm for linear and high-order nonlinear error in pipelined ADCs Fulltext Access 8 Pages 2010
Carbon nanotube field effect transistors for high performance analog applications: An optimum design approach Fulltext Access 8 Pages 2010
Post-linearization with image rejection for high IIP3 and image-rejection ratio of a 17 GHz CMOS low noise amplifier Fulltext Access 8 Pages 2010
Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process Fulltext Access 8 Pages 2010
System ESD robustness by co-design of on-chip and on-board protection measures Fulltext Access 8 Pages 2010
Generating sub-1V reference voltages from a resistorless CMOS bandgap reference circuit by using a piecewise curvature temperature compensation technique Fulltext Access 8 Pages 2010
Influence of Ag micro-particle additions on the microstructure, hardness and tensile properties of Sn–9Zn binary eutectic solder alloy Fulltext Access 8 Pages 2010
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis Fulltext Access 8 Pages 2010
Geometric design for ultra-long needle probe card for digital light processing wafer testing Fulltext Access 8 Pages 2010
Impedance and barrier capacitance of silicon diodes implanted with high-energy Xe ions Fulltext Access 8 Pages 2010
Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme Fulltext Access 8 Pages 2010