Strain sensitivity of gate leakage in strained-SOI nMOSFETs: A benefit for the performance trade-off and a novel way to extract the strain-induced band offset Fulltext Access 4 Pages 2009
Interface and border trap relaxation in Si–SiO2 structures with Ge nanocrystals examined by transient capacitance spectroscopy Fulltext Access 4 Pages 2009
Charge retention improvement of charge-trapping type flash device by plasma immersion ion implantation Fulltext Access 4 Pages 2009
Electrical characterization of metal-ferroelectric (Mn-substituted BiFeO3)-insulator (HfO2)-semiconductor capacitors for nonvolatile memory applications Fulltext Access 4 Pages 2009
Ultra-low-energy ion-beam-synthesis of Ge nanocrystals in thin ALD Al2O3 layers for memory applications Fulltext Access 4 Pages 2009
Impact of PDA temperature on electron trap energy and spatial distributions in SiO2/Al2O3 stack as the IPD in Flash memory cells Fulltext Access 4 Pages 2009
Program efficiency and high temperature retention of SiN/high-K based memories Fulltext Access 4 Pages 2009
Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1−x)AlxO2 films Fulltext Access 4 Pages 2009
Improved manufacturability of ZrO2 MIM capacitors by process stabilizing HfO2 addition Fulltext Access 4 Pages 2009
Lanthanum implantation for threshold voltage control in metal/high-k devices Fulltext Access 4 Pages 2009
Atomic-scale theory on current-assisted thermochemical degradation mode and its field acceleration via charge trapping of O vacancy in HfSiO4 Fulltext Access 4 Pages 2009
A first-principles study of the structural and electronic properties of III–V/thermal oxide interfaces Fulltext Access 4 Pages 2009
Atomic mechanism of flat-band voltage shifts at La2O3, Al2O3 and Nb2O5 capping layers Fulltext Access 4 Pages 2009
Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces Fulltext Access 4 Pages 2009
Experimental evidence of suppression on oxygen vacancy formation in Hf based high-κ gate dielectrics with La incorporation Fulltext Access 4 Pages 2009
Effect of high-temperature annealing on lanthanum aluminate thin films grown by ALD on Si(1 0 0) Fulltext Access 4 Pages 2009
Characterization of TiOxNy nanoparticles embedded in HfOxNy as charge trapping nodes for nonvolatile memory device applications Fulltext Access 4 Pages 2009
Applications of UV-nanoimprint soft stamps in fabrication of single-frequency diode lasers Fulltext Access 4 Pages 2009
Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks Fulltext Access 4 Pages 2009
Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter Fulltext Access 4 Pages 2009
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer Fulltext Access 4 Pages 2009
Electromagnetic immunity model of an ADC for microcontroller’s reliability improvement Fulltext Access 4 Pages 2009
Improved etching method for microelectronic devices with supercritical carbon dioxide Fulltext Access 4 Pages 2009
Kinetic Monte Carlo study on boron diffusion posterior to pre-amorphization implant process Fulltext Access 4 Pages 2009
Effect of low-frequency power on etching of SiCOH low-k films in CHF3 13.56 MHz/2 MHz dual-frequency capacitively coupled plasma Fulltext Access 4 Pages 2009
Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches Fulltext Access 4 Pages 2009
Annealing effect on physical and electrical characteristics of thin HfO2, HfSixOy and HfOyNz films on Si Fulltext Access 4 Pages 2009
Spectroscopic differentiation between O-atom vacancy and divacancy defects, respectively, in TiO2 and HfO2 by X-ray absorption spectroscopy Fulltext Access 4 Pages 2009
Performance improvement of flash memory using AlN as charge-trapping Layer Fulltext Access 4 Pages 2009
Self-aligned n-channel GaAs metal–oxide–semiconductor field-effect transistors (MOSFETs) using HfO2 and silicon interface passivation layer: Post-metal annealing optimization Fulltext Access 4 Pages 2009
“Smart” TDDB algorithm for investigating degradation in high-κ gate dielectric stacks under constant voltage stress Fulltext Access 4 Pages 2009
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs Fulltext Access 4 Pages 2009
A nanoanalytical investigation of high-k dielectric gate stacks for GaAs based MOSFET devices Fulltext Access 4 Pages 2009
Impact of temperature on non-equilibrium Fowler-Nordheim EEPROM programming Fulltext Access 4 Pages 2009
Thin silicon oxide films on N-type 4H–SiC prepared by scanning frequency anodization method Fulltext Access 4 Pages 2009
Mechanism of selective Si3N4 etching over SiO2 in hydrogen-containing fluorocarbon plasma Fulltext Access 4 Pages 2009
Controllable fabrication of carbon nanotube-polymer hybrid thin film for strain sensing Fulltext Access 4 Pages 2009
Low temperature sintering properties of Y-doped BaTiO3 ceramics by BaB2O4 sintering aid Fulltext Access 4 Pages 2009
Effects of silver oxalate additions on the physical characteristics of low-temperature-curing MOD silver paste for thick-film applications Fulltext Access 4 Pages 2009
Numerical simulation of spin coated P3HT organic thin film transistors with field dependent mobility and distributed contact resistance Fulltext Access 4 Pages 2009
MEMS/microelectronics self-assembly based on analogy of Langmuir–Blodgett approach Fulltext Access 4 Pages 2009
Electrical properties of Pt interconnects for passive crossbar memory arrays Fulltext Access 4 Pages 2009
Sputtered metal lift-off for grating fabrication on InP based optical devices Fulltext Access 4 Pages 2009
Interfacial microstructure and electrical properties of HfAlOx thin films on compressively strained Si83Ge17 grown by RF magnetron sputtering Fulltext Access 4 Pages 2009
Wet releasing and stripping SU-8 structures with a nanoscale sacrificial layer Fulltext Access 4 Pages 2009
The direct nano-patterning of ZnO using nanoimprint lithography with ZnO-sol and thermal annealing Fulltext Access 4 Pages 2009
Environmentally sustainable composite resistors with low temperature coefficient of resistance Fulltext Access 4 Pages 2009
Plastic deformation magnetic assembly of out-of-plane structures using vapour phase hydrofluoric (HF) acid release Fulltext Access 4 Pages 2009
High selectivity (SiN/SiO2) etching using an organic solution containing anhydrous HF Fulltext Access 4 Pages 2009
Surface acoustic wave characteristics of AlN thin films grown on a polycrystalline 3C-SiC buffer layer Fulltext Access 4 Pages 2009
Replication of high ordered nano-sphere array by nanoimprint lithography Fulltext Access 4 Pages 2009
The reduction of driving voltage in organic light-emitting devices by inserting step barrier layer Fulltext Access 4 Pages 2009
Study of polarization state of the transmitted light through the cholesteric liquid crystal Fulltext Access 4 Pages 2009
Electrical study of sulfur passivated In0.53Ga0.47As MOS capacitor and transistor with ALD Al2O3 as gate insulator Fulltext Access 4 Pages 2009
Electrical properties of atomic-layer-deposited La2O3 films using a novel La formamidinate precursor and ozone Fulltext Access 4 Pages 2009
Application of non-linear optical second harmonic generation and X-ray absorption and spectroscopies to defect related properties of Hf silicate and Hf Si oxynitride gate dielectrics Fulltext Access 4 Pages 2009
Characterization of interfacial reaction and chemical bonding features of LaOx/HfO2 stack structure formed on thermally-grown SiO2/Si(1 0 0) Fulltext Access 4 Pages 2009
Amorphous ternary rare-earth gate oxides for future integration in MOSFETs Fulltext Access 4 Pages 2009
Scaling potential and MOSFET integration of thermally stable Gd silicate dielectrics Fulltext Access 4 Pages 2009
Inhomogeneous Ni/Ge Schottky barriers due to variation in Fermi-level pinning Fulltext Access 4 Pages 2009
Molecular beam epitaxy passivation studies of Ge and III–V semiconductors for advanced CMOS Fulltext Access 4 Pages 2009
Effect of interface state trap density on the characteristics of n-type, enhancement-mode, implant-free In0.3Ga0.7As MOSFETs Fulltext Access 4 Pages 2009
Band offsets at interfaces of (1 0 0)InxGa1−xAs (0 ⩽ x ⩽ 0.53) with Al2O3 and HfO2 Fulltext Access 4 Pages 2009
Challenges of integration of high-κ dielectric with III–V materials (Invited Paper) Fulltext Access 4 Pages 2009
Interface studies of ALD-grown metal oxide insulators on Ge and III–V semiconductors (Invited Paper) Fulltext Access 4 Pages 2009
Chemical modification of carbon nanotube for improvement of field emission property Fulltext Access 4 Pages 2009
The law of ultrasonic energy conversion in thermosonic flip chip bonding interfaces Fulltext Access 4 Pages 2009
Formation of Ge nanocrystals in a silicon dioxide layer using pulsed plasma-immersion ion implantation Fulltext Access 4 Pages 2009
Characterization of ZrO2 thin films deposited by MOCVD for high-density 3D capacitors Fulltext Access 4 Pages 2009
N-channel thin-film transistors constructed on plastic by solution processes of HgSe nanocrystals Fulltext Access 4 Pages 2009