Anomalous narrow width effect in p-channel metal–oxide–semiconductor surface channel transistors using shallow trench isolation technology Fulltext Access 4 Pages 2008
Near-field detection of photon emission from silicon with 30 nm spatial resolution Fulltext Access 4 Pages 2008
Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications Fulltext Access 4 Pages 2008
Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling Fulltext Access 4 Pages 2008
Microsystems elements based on free-standing thick-films made with a new sacrificial layer process Fulltext Access 4 Pages 2008
Study of copper drift during TDDB of intermetal dielectrics by using fully passivated MOS capacitors as test vehicle Fulltext Access 4 Pages 2008
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET Fulltext Access 4 Pages 2008
Synthesis of SrAl2O4: Eu2+, Dy3+, Gd3+ phosphor by combustion method and its phosphorescence properties Fulltext Access 4 Pages 2008
Experimental evidence of “latent gate oxide damages” in medium voltage power MOSFET as a result of heavy ions exposure Fulltext Access 4 Pages 2008
High performance, FPGA-based test apparatus for unclamped inductive switching of IGBTs Fulltext Access 4 Pages 2008
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric Fulltext Access 4 Pages 2008
3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET Fulltext Access 4 Pages 2008
Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants Fulltext Access 4 Pages 2008
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications Fulltext Access 4 Pages 2008
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure Fulltext Access 4 Pages 2008
Low-cost preparation method for exposing IC surfaces in stacked die packages by micro-abrasive blasting Fulltext Access 4 Pages 2008
Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures Fulltext Access 4 Pages 2008
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors Fulltext Access 4 Pages 2008
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications Fulltext Access 4 Pages 2008
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs Fulltext Access 4 Pages 2008
Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices Fulltext Access 4 Pages 2008
Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation Fulltext Access 4 Pages 2008
Fracture morphology and mechanism of IMC in Low-Ag SAC Solder/UBM (Ni(P)-Au) for WLCSP Fulltext Access 4 Pages 2008
Optimization of gate poly TAB size and reliability on short channel pMOSFET Fulltext Access 4 Pages 2008
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer Fulltext Access 4 Pages 2008
Voltage acceleration of time dependent breakdown of ultra-thin NO and NON dielectrics Fulltext Access 4 Pages 2008
Improved performances of a two-step passivated heterojunction bipolar transistor Fulltext Access 4 Pages 2008
Impact of inside spacer process on fully self-aligned 250 GHz SiGe:C HBTs reliability performances: a-Si vs. nitride Fulltext Access 4 Pages 2008
InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability Fulltext Access 4 Pages 2008
Effect of a trace of water vapor on Ohmic contact formation for AlGaN/GaN epitaxial wafers Fulltext Access 4 Pages 2008
Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer Fulltext Access 4 Pages 2008
Diffusion barrier performance of Zr–N/Zr bilayered film in Cu/Si contact system Fulltext Access 4 Pages 2008
Investigation of diode geometry and metal line pattern for robust ESD protection applications Fulltext Access 4 Pages 2008
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET Fulltext Access 4 Pages 2008
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications Fulltext Access 5 Pages 2008
Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes Fulltext Access 5 Pages 2008
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique Fulltext Access 5 Pages 2008
Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology Fulltext Access 5 Pages 2008
A four-point-bending-test for the stability assessment of glass frit bonded molded microsensors Fulltext Access 5 Pages 2008
Dependency of thermal spreading resistance on convective heat transfer coefficient Fulltext Access 5 Pages 2008
Study of temperature dependent properties of organic substrate materials Fulltext Access 5 Pages 2008
Evaluation of conductive-to-resistive layers interaction in thick-film resistors Fulltext Access 5 Pages 2008
The self-formatting barrier characteristics of Cu–Mg/SiO2 and Cu–Ru/SiO2 films for Cu interconnects Fulltext Access 5 Pages 2008
Piezoelectric polymer films as power converters for human powered electronics Fulltext Access 5 Pages 2008
Highly reliable processes for embedding discrete passive components into organic substrates Fulltext Access 5 Pages 2008
Quality factor measurement of micro gyroscope structure according to vacuum level and desired Q-factor range package method Fulltext Access 5 Pages 2008
A fringing-capacitance model for deep-submicron MOSFET with high-k gate dielectric Fulltext Access 5 Pages 2008
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED Fulltext Access 5 Pages 2008
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits Fulltext Access 5 Pages 2008
Determination of temperature change inside IC packages during laser ablation of molding compound Fulltext Access 5 Pages 2008
Silicon based system in package: Improvement of passive integration process to avoid TBMS failure Fulltext Access 5 Pages 2008
Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures Fulltext Access 5 Pages 2008
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation Fulltext Access 5 Pages 2008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches Fulltext Access 5 Pages 2008
Temperature stability of a piezoresistive MEMS resonator including self-heating Fulltext Access 5 Pages 2008
Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode Fulltext Access 5 Pages 2008
Laser decapsulation of plastic packages for failure analysis: Process control and artefact investigations Fulltext Access 5 Pages 2008
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip Fulltext Access 5 Pages 2008
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology Fulltext Access 5 Pages 2008
Effect of crystallographic defects on the reverse performance of 4H–SiC JBS diodes Fulltext Access 5 Pages 2008
Novel simulation approach for transient analysis and reliable thermal management of power devices Fulltext Access 5 Pages 2008
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology Fulltext Access 5 Pages 2008
PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization Fulltext Access 5 Pages 2008
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields Fulltext Access 5 Pages 2008
Fast electromigration wafer mapping for wafer fab process monitoring and improvement Fulltext Access 5 Pages 2008
Determination of migration effects in Cu-via structures with respect to process-induced stress Fulltext Access 5 Pages 2008
Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction Fulltext Access 5 Pages 2008
Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes Fulltext Access 5 Pages 2008
ESD sensitivity investigation on a wide range of high density embedded capacitors Fulltext Access 5 Pages 2008
Thermal modeling of high frequency DC–DC switching modules: Electromagnetic and thermal simulation of magnetic components Fulltext Access 5 Pages 2008
Defect analysis concerning variation in characteristics of PIN diode for Hybrid Vehicles Fulltext Access 5 Pages 2008