Article ID Journal Published Year Pages File Type
10267051 Electrochemistry Communications 2005 4 Pages PDF
Abstract
Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.
Related Topics
Physical Sciences and Engineering Chemical Engineering Chemical Engineering (General)
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