Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10267051 | Electrochemistry Communications | 2005 | 4 Pages |
Abstract
Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Ã
is comparable to the value calculated from capillary wave theory (7.3Â Ã
) using the measured interfacial tension of 12.6Â mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Chemical Engineering (General)
Authors
Guangming Luo, Sarka Malkova, Sai Venkatesh Pingali, David G. Schultz, Binhua Lin, Mati Meron, Timothy J. Graber, Jeffrey Gebhardt, Petr Vanysek, Mark L. Schlossman,