| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10357834 | Journal of Computational Physics | 2005 | 17 Pages |
Abstract
In this paper, we discuss a simple iterative-perturbation scheme for solving the elasticity equation in systems with strong elastic inhomogeneity. As an example, a thin film in contact with a gas and a substrate is considered. The scheme is demonstrated to be efficient through numerical experiments and reliable through rigorous mathematical justification. It is then applied to the study of the inhomogeneous shear modulus effect on the microstructure evolution in thin films based on the phase-field method.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Science Applications
Authors
P. Yu, S.Y. Hu, L.Q. Chen, Q. Du,
