Article ID Journal Published Year Pages File Type
10360778 Pattern Recognition 2005 15 Pages PDF
Abstract
For learning-based tasks such as image classification, the feature dimension is usually very high. The learning is afflicted by the curse of dimensionality as the search space grows exponentially with the dimension. Discriminant-EM (DEM) proposed a framework by applying self-supervised learning in a discriminating subspace. This paper extends the linear DEM to a nonlinear kernel algorithm, Kernel DEM (KDEM), and evaluates KDEM extensively on benchmark image databases and synthetic data. Various comparisons with other state-of-the-art learning techniques are investigated for several tasks of image classification. Extensive results show the effectiveness of our approach.
Related Topics
Physical Sciences and Engineering Computer Science Computer Vision and Pattern Recognition
Authors
, , , ,