Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10361304 | Pattern Recognition | 2005 | 12 Pages |
Abstract
The rotational invariance is achieved by using these two wavelets with their directional properties and the scale invariance is achieved by a method, which is an extension to fractal dimension (FD) features. The first- and second-order statistical parameter and entropy characterize the quality of the features extracted. Furthermore, a comparison that shows the higher recognition rate achieved with the newly proposed method for the set of 6720 samples collected from 105 different textures of Brodatz, Vistek, Indezine databases and some additional images collected from other resources of indexed and true color images is shown.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
K. Muneeswaran, L. Ganesan, S. Arumugam, K. Ruba Soundar,