| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10361451 | Pattern Recognition Letters | 2012 | 8 Pages |
Abstract
⺠We search an optimal reconstruction resolution for given non-uniform point sets. ⺠We use a statistically-derived topology-controller to find the optimal resolution. ⺠The proposed topology-controller is derived from homology-based statistics. ⺠We can evaluate of the reconstruction process the need of visual inspection. ⺠We show qualitative comparisons and results of the proposed approach.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Erald Vuçini, Walter G. Kropatsch,