Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10362207 | Pattern Recognition Letters | 2005 | 10 Pages |
Abstract
We implement structural risk minimization and cross-validation in order to optimize kernel and parameters of a support vector machine (SVM) and multiclass SVM-based image classifiers, thereby enabling the diagnosis of genetic abnormalities. By thresholding the distance of patterns from the hypothesis separating the classes we reject a percentage of the miss-classified patterns reducing the expected risk. Accurate performance of the SVM in comparison to other state-of-the-art classifiers demonstrates the benefit of SVM-based genetic syndrome diagnosis.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Amit David, Boaz Lerner,