Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10400976 | Diamond and Related Materials | 2005 | 8 Pages |
Abstract
FTIR spectra of faceted diamonds and diamond simulants collected by diffuse reflectance, transflectance, and specular reflection techniques were compared. The transflectance technique exploited total internal reflection phenomenon within the faceted diamond for the spectral acquisition. The transflectance spectra were similar to the well-accepted diffuse reflectance spectra with equal or better spectral qualities. Based on the observed spectral features of the faceted diamond, classification of the diamond, determination of defects, impurities, and treatment process (i.e., irradiation and high pressure and high temperature) can be performed.
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Authors
Pimthong Thongnopkun, Sanong Ekgasit,