| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10566152 | Organic Electronics | 2013 | 7 Pages |
Abstract
- Electrical and morphological characterization of flexible OTFT devices under applied bending-stress is reported.
- Bending-stress modifies the lateral spacing between individual pentacene crystallites.
- The deterioration of the metal electrodes is found to be responsible for irreversibilities in the device characteristics.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Chemistry (General)
Authors
V. Scenev, P. Cosseddu, A. Bonfiglio, I. Salzmann, N. Severin, M. Oehzelt, N. Koch, J.P. Rabe,