| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10706864 | Current Applied Physics | 2005 | 4 Pages |
Abstract
A novel microscope light scattering spectroscopy and image analyzing system has been developed for simultaneous measurements on particle size distribution in solutions with size ranging from nanometer to sub-millimeter, and for surface porosity analysis on solid materials. The present paper introduces the technique of this system and its applications to various materials.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yao-Xiong Huang,