| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 10734115 | Radiation Physics and Chemistry | 2005 | 5 Pages | 
Abstract
												In this work we present an experimental characterization of beam guides for X-ray fluorescence analysis by total reflection. These devices have been described and characterized numerically in previous works, a brief review is given here. Plate, tapered and triangular-shaped beam guides, of several dimensions were used. The experimental setup and samples were chosen in order to reproduce previous numerical calculations. Measurements were carried out in normal working condition and under special situations so as to verify the calculated data using a conventional X-ray source and synchrotron radiation. After the spectrum analysis stage, the obtained results showed an excellent agreement with the curves predicted theoretically. The detection limits obtained in the measurements are quite similar to those usually reported in TXRF experiments using traditional TR systems.
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													Radiation
												
											Authors
												Héctor Jorge Sánchez, MarÃa Cecilia Valentinuzzi, 
											