| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1149915 | Journal of Statistical Planning and Inference | 2008 | 11 Pages |
Abstract
This paper discusses a new perspective in fitting spatial point process models. Specifically the spatial point process of interest is treated as a marked point process where at each observed event x a stochastic process M(x;t), 0
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Yongtao Guan,