Desorption electrospray ionization–mass spectrometric analysis of low vapor pressure chemical particulates collected from a surface

•DESI–MS analysis of low vapor pressure chemical particulates collected from a surface.•Investigated collection of low vapor pressure chemical particulates from surfaces.•Successfully analyzed chemical particulates collected on sticky screen sampler using DESI–MS.•Demonstrated µg level detection limits for chemical particulates.•Normalized data against the total ion current (TIC) enabling good reproducibility.•Successfully determined mass of TEP in a sample with 14% accuracy.

The collection of a low vapor pressure chemical simulant triethyl phosphate sorbed onto silica gel (TEP/SG) from a surface with subsequent analysis of the TEP/SG particulates using desorption electrospray ionization–mass spectrometry (DESI–MS) is described. Collection of TEP/SG particulates on a surface was accomplished using a sticky screen sampler composed of a stainless steel screen coated with partially polymerized polydimethylsiloxane (PDMS). DESI–MS analysis of TEP/SG particulates containing different percentages of TEP sorbed onto silica gel enabled the generation of response curves for the TEP ions m/z 155 and m/z 127. Using the response curves the calculation of the mass of TEP in a 25 wt% sample of TEP/SG was calculated, results show that the calculated mass of TEP was 14% different from the actual mass of TEP in the sample using the m/z 127 TEP ion response curve. Detection limits for the TEP vapor and TEP/SG particulates were calculated to be 4 μg and 6 particles, respectively.

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