Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1279030 | International Journal of Hydrogen Energy | 2009 | 4 Pages |
Abstract
Defects induced by X-ray irradiation in the soda-lime silicate glass were studied by means of optical spectrophotometric and electron spin resonance measurements. The defects attributed to three absorption peaks at 610, 425 and 305Â nm which were observed in the glass after X-ray radiation. The induced defects were unstable at room temperature or after thermal annealing treatment. The Smakula's formula was applied to calculate the induced defects, and the concentration of induced NBOHC correlating the absorption band at 610Â nm in glass after X-ray irradiation for 35Â min was calculated to be about 9.80Â ÃÂ 1018/cm3. The linear relationship between NBOHC number and absorption at 610Â nm confirmed that the absorption at 610Â nm may attribute to the induced NBOHCs.
Related Topics
Physical Sciences and Engineering
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Authors
Jiawei Sheng, Xinji Yang, Wen Dong, Jian Zhang,