| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1404606 | Journal of Molecular Structure | 2006 | 5 Pages |
Abstract
The films of (BEDT-TTF)2XF6 (where X=P, Sb) and (BEDT-TTF)[Ni(dmit)2]2 were electrodeposited on an intrinsic Si(001) electrode. All samples are examined by scanning electron microscopy, X-ray diffraction data and Raman spectra. The results evidence that new (BEDT-TTF)2SbF6 and (BEDT-TTF)[Ni(dmit)2]2 phases (compared to those obtained on a common Pt wire) are grown on the silicon electrode.
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Authors
A. Kowalska, J.-P. Savy, D. de Caro, C. Faulmann, L. Valade, J. Ulanski,