Article ID Journal Published Year Pages File Type
1482317 Journal of Non-Crystalline Solids 2011 4 Pages PDF
Abstract

Bi3.15Nd0.85Ti2.8-xZr0.2MnxO12 (BNTZM) thin films with various Mn content (x = 0, 0.005, 0.01, 0.03, and 0.05) have been prepared on Pt/Ti/SiO2/Si (100) substrates by a chemical solution deposition (CSD) technique. The crystal structures of BNTZM thin film have been analyzed by X-ray diffraction (XRD). The dependence of Mn contents on the ferroelectric, dielectric properties, and leakage current of these BNTZM films have been thoroughly investigated. The XRD analysis demonstrated that all the BNTZM thin films were of typical bismuth-layer-structured ferroelectrics (BLSF) polycrystalline structure and exhibited a highly preferred (117) orientation. Among these BNTZM films, the BNTZM thin film with Mn content equal to 0.01 exhibits the maximum remnant polarization (2Pr) of 48μC/cm2 and a low coercive field (2Ec) of 177 kV/cm. In addition, the BNTZM thin film with x = 0.01 (Mn) showed a fatigue-free behavior up to 1 × 1010 read/write cycles.

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Physical Sciences and Engineering Materials Science Ceramics and Composites
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