Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1483125 | Journal of Non-Crystalline Solids | 2008 | 4 Pages |
Abstract
Cu(In,Ga)Se2 polycrystalline thin films were deposited adopting the potentiostatic electrochemical method on Mo/soda lime glass substrate. All the as-deposited Cu(In,Ga)Se2 thin films were annealed in a selenium atmosphere at 550 °C for 1 h to improve the film crystalline properties. The selenized CIGS thin films were characterized by energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and scanning electron microscopy (SEM).The results indicate Cu(In,Ga)Se2 thin films have single chalcopyrite structure and the grain size varies from 0.8 to 2.5 μm.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Donglin Xia, Jangzhuang Li, Man Xu, Xiujian Zhao,