Article ID Journal Published Year Pages File Type
1483125 Journal of Non-Crystalline Solids 2008 4 Pages PDF
Abstract

Cu(In,Ga)Se2 polycrystalline thin films were deposited adopting the potentiostatic electrochemical method on Mo/soda lime glass substrate. All the as-deposited Cu(In,Ga)Se2 thin films were annealed in a selenium atmosphere at 550 °C for 1 h to improve the film crystalline properties. The selenized CIGS thin films were characterized by energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and scanning electron microscopy (SEM).The results indicate Cu(In,Ga)Se2 thin films have single chalcopyrite structure and the grain size varies from 0.8 to 2.5 μm.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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