| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1483168 | Journal of Non-Crystalline Solids | 2009 | 4 Pages |
Abstract
Photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered thin films are studied by X-ray photoelectron spectroscopy (XPS). The XPS measurements show the atomic movements during photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered film. The analysis of experimental data describes the nature of light induced changes in different structural units.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Ramakanta Naik, K.V. Adarsh, R. Ganesan, K.S. Sangunni, S. Kokenyesi, Uday Deshpande, T. Shripathi,