Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1484399 | Journal of Non-Crystalline Solids | 2005 | 7 Pages |
Abstract
In the present study we have carried out non-destructive surface characterization of a float glass using total reflection X-ray fluorescence (TXRF) technique and X-ray reflectivity (XRR). The in-depth distribution of Sn and Fe impurities has been determined by TXRF where as X-ray optical properties such as r.m.s surface roughness, refractive index, etc., have been derived by XRR. The results obtained so are used in analyzing the soft X-ray optical constants in the wavelength region of 80–200 Å. The results obtained indicate that two surfaces of float glass differ significantly.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
M.K. Tiwari, M.H. Modi, G.S. Lodha, A.K. Sinha, K.J.S. Sawhney, R.V. Nandedkar,