Article ID Journal Published Year Pages File Type
1484504 Journal of Non-Crystalline Solids 2008 4 Pages PDF
Abstract

The electrical properties of n-type titanium dioxide thin films deposited by magnetron-sputtering method have been investigated by temperature-dependent conductivity. We observed that the temperature dependence of the electrical conductivity of titanium dioxide films exhibits a crossover from T−1/4 to T−1/2 dependence in the temperature range between 80 and 110 K. Characteristic parameters describing conductivity, such as the characteristic temperature (T0), hopping distance (Rhop), average hopping energy (Δhop), Coulomb gap (ΔC), localization length (ξ) and density of states (N(EF)), were determined, and their values were discussed within the models describing conductivity in TiO2 thin films.

Keywords
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
, , , ,