Electrical properties of a-Ge-Se-In thin films

Steady state and transient photoconductivity has been measured on Ge20Se80−xInx (x = 0, 5, 10, 15, 20) vacuum evaporated thin films. Study of temperature dependent dark conductivity σd and photoconductivity σph measurements in the temperature range 303–375 K, shows that the conduction in this glass is through an activated process having single activation energy. The activation energy value of photoconduction is smaller in comparison to activation energy in dark. The photosensitivity shows a maximum value at 10 at.% of In concentration. This is attributed to the decrease in the density of defect states of Ge–Se alloy with increase of In content. The results of intensity dependent steady state photoconductivity σph follow a power law with intensity (F), i.e. σph α Fγ where the value of power γ lies between 0.5 and 1.0, suggesting bimolecular recombination. Rise and decay of photocurrent for different concentration of In shows that photocurrent rises monotonically to the steady state value and the decay of photocurrent is also very fast. An attempt has been made to explain the results on the basis of defects and density of states.