Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1485084 | Journal of Non-Crystalline Solids | 2008 | 5 Pages |
Abstract
We report fabrication of a three-dimensionally nanostructured porous alumina film on a glass substrate exhibiting an angle-insensitive optical transmission property using a robust anodization with ‘fictive critical anodizing-voltage’ estimation technique. The fictive critical anodizing-voltage is estimated from a resistance profile curvature; it offers a limit of a maximum cell size of an anodization system. Using this technique, we have obtained an extra-large cell (over 1 μm) and thick (∼2.5 μm) alumina film. Observation of a fine structure on the current density profile at the initial anodizing stage is also presented with resistance profiling, cross-sectional scanning and transmission electron microscopies.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Y. Katsuta, A. Yasumori, K. Wada, K. Kurashima, S. Suehara, S. Inoue,