| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1485313 | Journal of Non-Crystalline Solids | 2007 | 5 Pages |
Abstract
The crystallization kinetics in Ni50.54Ti49.46 film was studied by differential scanning calorimetry through continuous heating and isothermal annealing. The activation energy for crystallization was determined to be 411 and 315Â kJ/mol by Kissinger and Augis & Bennett method, respectively. In the isothermal annealing study, The Avrami exponents were in the range of 2.63-3.12 between 793 and 823Â K, suggesting that the isothermal annealing was governed by diffusion-controlled three-dimensional growth for Ni50.54Ti49.46 thin films.
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Authors
K.T. Liu, J.G. Duh,