Article ID Journal Published Year Pages File Type
1485409 Journal of Non-Crystalline Solids 2007 5 Pages PDF
Abstract
The atomic structure of amorphous As2Se3 and As2S3 films prepared by thermal evaporation in a vacuum and by RF ion-plasma sputtering has been studied by the methods of X-ray diffraction and Raman spectroscopy. The techniques of film preparation had different conditions of substance vaporization and atom condensation on a substrate. It has been established that films prepared by these methods have significant differences in the dimensions of the medium-range order and in the local atomic structure, which causes considerable differences in their electronic properties.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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