Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1485409 | Journal of Non-Crystalline Solids | 2007 | 5 Pages |
Abstract
The atomic structure of amorphous As2Se3 and As2S3 films prepared by thermal evaporation in a vacuum and by RF ion-plasma sputtering has been studied by the methods of X-ray diffraction and Raman spectroscopy. The techniques of film preparation had different conditions of substance vaporization and atom condensation on a substrate. It has been established that films prepared by these methods have significant differences in the dimensions of the medium-range order and in the local atomic structure, which causes considerable differences in their electronic properties.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Sh.Sh. Sarsembinov, O.Yu. Prikhodko, A.P. Ryaguzov, S.Ya. Maksimova, V.Zh. Ushanov,