| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1485809 | Journal of Non-Crystalline Solids | 2006 | 4 Pages |
Abstract
We present results of optical pump – terahertz probe experiments applied to a set of thin film silicon samples on sapphire substrates. Structure of the films varied from amorphous to fully microcrystalline. Picosecond time scale evolution of electrical transport properties of photoexcited samples is investigated and discussed. Three different mechanisms are found to contribute to the dynamical conductivity at terahertz frequencies.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
L. Fekete, H. Němec, F. Kadlec, P. Kužel, J. Stuchlı´k, A. Fejfar, J. Kočka,