Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1486724 | Journal of Non-Crystalline Solids | 2005 | 6 Pages |
Abstract
Electrical measurements have been carried out on a-Se85âxTe15Sbx (x = 0, 2, 4, 6 and 10 at.%) thin films. The dark conductivity (Ïd), photoconductivity (Ïph) increase and activation energy (ÎEd) decreases as the concentration of Sb additive increases (upto 4 at.%). Photosensitivity (Ïph/Ïd) decreases sharply after Sb incorporation. The charge carrier concentration (nÏ) is calculated with the help of dc conductivity measurements and its value increases with Sb incorporation. A reverse in the trend takes place in all these parameters as the Sb concentration is further increased (>4 at.%). The results are explained on the basis of increase in the density of localized states present in the mobility gap of Se-Te-Sb alloys.
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Authors
S.K. Tripathi, Vineet Sharma, Anup Thakur, Jeewan Sharma, G.S.S. Saini, N. Goyal,