Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1564906 | Journal of Nuclear Materials | 2015 | 8 Pages |
Abstract
Relevant parameters for trapping of Hydrogen Isotopes (HIs) in polycrystalline tungsten are determined with the MHIMS code (Migration of Hydrogen Isotopes in MaterialS) which is used to reproduce Thermal Desorption Spectrometry experiments. Three types of traps are found: two intrinsic traps (detrapping energy of 0.87Â eV and 1.00Â eV) and one extrinsic trap created by ion irradiation (detrapping energy of 1.50Â eV). Then MHIMS is used to simulate HIs retention at different fluences and different implantation temperatures. Simulation results agree well with experimental data. It is shown that at 300Â K the retention is limited by diffusion in the bulk. For implantation temperatures above 500Â K, the retention is limited by trap creation processes. Above 600Â K, the retention drops by two orders of magnitude as compared to the retention at 300Â K. With the determined detrapping energies, HIs outgassing at room temperature is predicted. After ions implantation at 300Â K, 45% of the initial retention is lost to vacuum in 300Â 000Â s while during this time the remaining trapped HIs diffuse twice as deep into the bulk.
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Authors
E.A. Hodille, X. Bonnin, R. Bisson, T. Angot, C.S. Becquart, J.M. Layet, C. Grisolia,