| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1565228 | Journal of Nuclear Materials | 2013 | 5 Pages |
Abstract
The effect of 320 keV Xe2+ ion-irradiation in Cr2AlC and Cr2GeC is investigated in situ in the transmission electron microscope. Both compounds amorphize at moderate fluences (1013–1014 Xe cm−2) but exhibit different amorphization mechanisms, bearing witness of the major influence of the chemical composition of the nanolaminated Mn+1AXn phases. It is proposed that amorphization takes place via a direct impact amorphization process in Cr2GeC whereas it is governed by a defect accumulation process in Cr2AlC.
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Authors
Matthieu Bugnet, Vincent Mauchamp, Erwan Oliviero, Michel Jaouen, Thierry Cabioc’h,