| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1566805 | Journal of Nuclear Materials | 2011 | 6 Pages |
Abstract
Various methods of Kearns “f” parameter evaluation were compared for their consistency and dependency on measurement cross section of the sample and variation in the microstructure across different cross sections. The study showed that, EBSD (Electron Back Scattered Diffraction) method is more consistent in comparison to X-ray based techniques for the “f” parameter determination especially in case of recrystallized microstructures.
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Authors
K.V. Mani Krishna, D. Srivastava, G.K. Dey, V. Hiwarkar, I. Samajdar, N. Saibaba,