| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1566825 | Journal of Nuclear Materials | 2011 | 5 Pages |
Abstract
⺠Different radiation responses on the individual layer thickness were revealed. ⺠The highly morphological stability was observed in multilayered structure. ⺠Cu/W5 samples exhibited better radiation resistance in our experiments. ⺠The sink effects offered by the interfaces and grain boundaries were mentioned.
Related Topics
Physical Sciences and Engineering
Energy
Nuclear Energy and Engineering
Authors
Yuan Gao, Tengfei Yang, Jianming Xue, Sha Yan, Shengqiang Zhou, Yugang Wang, Dixon T.K. Kwok, Paul K. Chu, Yanwen Zhang,