| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1567132 | Journal of Nuclear Materials | 2010 | 15 Pages |
Microstructural evolution of the partial transient liquid phase diffusion bonded Zircaloy-4 and stainless steel 321 using an active Ti-base interlayer were studied at different temperatures. Additionally, simple analytical models were developed to predict the evolution of the interlayer and intermetallics during the bonding operation. Bonds were characterized by scanning electron microscopy and energy dispersive X-ray spectrometry. Precision measurement of the interlayer width was made as a function of the bonding temperature. The liquid film migration occurred as a result of chemical solubility differences between the stable and metastable phases. The formation and growth model of the intermetallic compounds at the interfaces of Zircaloy-4/Ti-base interlayer and stainless steel 321/Ti-base interlayer for controlling the bonding process was studied considering the diffusion kinetics and the thermodynamics. The evolution of the interlayer thickness indicated a good agreement between the calculation and experimental measurement. It was also demonstrated that the low isothermal solidification kinetic was not only due to the enrichment of the liquid phase with the base alloying elements such as Ti and Zr, but also the reduction of solid solubility limit of Cu in the base alloys contributed to the reduction of isothermal solidification kinetic.
