Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1567152 | Journal of Nuclear Materials | 2011 | 4 Pages |
Abstract
A novel method for the fabrication of test samples for fission gas behavior studies is described. We applied the technique of ion beam assisted deposition (IBAD) as a means to introduce Xe atoms into alumina (Al2O3) films. We then investigated the redistribution of Xe atoms and microstructural evolution induced by annealing. Transmission electron microscopy analysis revealed that the microstructure of our Al2O3-Xe IBAD films resemble characteristic microstructural features associated with fission gas accumulation in reactor-irradiated nuclear fuels.
Related Topics
Physical Sciences and Engineering
Energy
Nuclear Energy and Engineering
Authors
I.O. Usov, J. Won, D.J. Devlin, Y.-B. Jiang, J.A. Valdez, K.E. Sickafus,