| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1567641 | Journal of Nuclear Materials | 2009 | 6 Pages |
Abstract
The dependence of the D retention on the damage level and the implanted fluence was studied, and the results show saturation for 0.4Â dpa independent of the deuterium implantation fluence. Additionally, it was observed that self-implantation introduces high temperature traps which can almost completely be removed by annealing at 1200Â K.
Related Topics
Physical Sciences and Engineering
Energy
Nuclear Energy and Engineering
Authors
B. Tyburska, V.Kh. Alimov, O.V. Ogorodnikova, K. Schmid, K. Ertl,