Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1567834 | Journal of Nuclear Materials | 2010 | 7 Pages |
Abstract
Diffusion coefficients of helium in solid UO2+x at high temperature and various stoichiometric compositions are evaluated by using molecular dynamics simulations based on a partly-ionic model in conjunction with a polaron ‘Free Hopping Approximation’ proposed earlier. The results are compared with existing experimental and simulation data. A strong dependence of the apparent diffusion activation energy on stoichiometry is found and the mechanisms of He migration in non-stoichiometric solid UO2+x are discussed.
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Authors
E. Yakub, C. Ronchi, D. Staicu,