Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1569176 | Journal of Nuclear Materials | 2007 | 6 Pages |
Abstract
Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching â¼60 μm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.
Keywords
Related Topics
Physical Sciences and Engineering
Energy
Nuclear Energy and Engineering
Authors
J. Likonen, J.P. Coad, E. Vainonen-Ahlgren, T. Renvall, D.E. Hole, M. Rubel, A. Widdowson, JET-EFDA Contributors JET-EFDA Contributors,