| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1631048 | Materials Today: Proceedings | 2015 | 5 Pages |
Abstract
Sol-gel based single and multilayer (TiO2, SiO2-TiO2, SiO2) thin films synthesized and characterized for optical application. The reflection value is reasonable reduced from the surface of glass by integrating the multilayer thin films, behaving as an ARC. The multilayered reflection profiles of simulated and experimental curves are observed around 0.188%. The prepared samples have been shown with very good agreement between the simulated and the experimental reflectance values for multilayer.
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Physical Sciences and Engineering
Materials Science
Metals and Alloys
